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RF
and High-Speed ICs: ECE1365S
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Circuits Engineering: ECE534F
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Circuits: ECE331S
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Electronics
Group
Elec.
& Comp. Eng.
Univ.
of Toronto
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Sorin
P. Voinigescu Professor Department
of Electrical and Computer Engineering University
of Toronto
Welcome!
My
goal is to explore novel silicon systems on chip (SoCs) operating
in the largely un-chartered 100-300 GHz range of the
electromagnetic spectrum, to demonstrate their commercial
viability, hopefully leading to new applications for silicon
nano-electronics, new products, new companies and wealth creation.
The main
applications are in telecommunications, radiometry, radio
astronomy, high-resolution imaging, industrial, remote, and
environmental sensing. Most of these fields
have yet to benefit from silicon technology scaling. One of the
many challenges is the lack of transistor and passive component
characterization metrology and modelling techniques above 110
GHz., making circuit and system level design in this frequency
range even more daunting. To overcome these hurdles, a
multi-thronged approach at the device, IC, and SoC level will be
pursued. Some of the research topics are
Novel
active and passive device noise characterization techniques based
on integrating the entire test set-up on a single silicon die to
overcome losses and measurement uncertainty above 100 GHz
New
120-160GHz radio and active imager architectures taking advantage
of micro-machined high-Q, 100+GHz silicon dielectric resonators,
switched beams, and above IC antennas
New
100-300 GHz passive imager and radiometer architectures with
“zoom-in” capability based on a large number of
switched phased arrayed receivers, on novel thermal calibration
algorithms and employing either on-die or waveguide-mounted
antenna arrays
High
resolution, self-calibrated position, speed and motion sensor
with on die antennas operating at 120 GHz in hostile industrial
environments
110
GEthernet and wireline serial and parallel transceivers with
equalization
Digitally-enhanced
mm-wave radio and wireline circuits
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