ECE 1767: Lecture Notes
Spring 2002
Lecture Notes
Lecture notes are also available at Copywell
- Intro: Simulation, Verification, Fault
Modeling, Testing and Metrics.
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- Logic Simulation, 3-value Simulation, Event Driven Simulation
with Delay Consideration
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- Fault Modeling: Stuck-at Fault, Delay Fault, Opens,
Bridges, IDDQ Fault, Fault Equivalence, Fault Dominance, Testing, Method of
Boolean Difference
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- Fault Simulation , Serial,
Parallel and Deductive Fault Simulation, Star Algorithm,
Critical Path Tracing, STAFAN
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- Intro to ATPG I:
Basic Concepts and Terminology (Backtracking, AND-OR Decision Trees)
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- Intro to ATPG II: D-Algorithm, PODEM, FAN, SCOAP,
SMAs and dominators, intro to static and dynamic learning,
Fault masking, Random TPG, Test Compaction
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- Sequential Machine Testing
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- Bridge Fault Testing
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- Memory Testing
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- Design for Testability, Scan Registers and
Chains, DFT Architectures and Algorithms, System Level Testing
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- BIST Architectures, LFSRs and Signature Analyzers
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- Core Testing
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