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application/pdfIEEE2019 IEEE International Reliability Physics Symposium (IRPS);2019; ; ; Electromigrationhydrostatic stressverificationpower gridreliabilitylinear time invariant systemEfficient Simulation of Electromigration Damage in Large Chip Power Grids Using Accurate Physical Models (Invited Paper)Farid N. NajmValeriy Sukharev
2019 IEEE International Reliability Physics Symposium (IRPS)1 March 201910
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