Talk 3.2: 9:30AM–10:45AM
| Session Name: | Advances in Power Delivery and Protection |
| Session Time: | 9:30AM–10:45AM |
| Author Name: | Ivan K Boev |
| Author Email: | ivan.boev@utoronto.ca |
| Talk Title: | Radiated EM Fields During Lightning Strikes of the CN Tower |
| Slides: | 3-2.ppt |
| Abstract: | Lightning is one of the most spectacular natural phenomena. It is characterized by large currents (kA), very long path lengths (km), and extremely high voltages (MV). Lightning has primary and secondary detrimental effects on electrical installations, power system networks, electrical devices, human beings, and livestock. The direct strike (primary effect) to an object is often devastating but fortunately less probable, as opposed to the influence of the radiated electromagnetic (EM) fields at a distance (secondary effect). A tall structure in the lightning path acts as an amplifier of EM fields. In the case of the 553 m high CN Tower (CNT) this field enhancement is about 3 times. As the number of special electronic devices sensible to different components of the EM field increases, accurate modeling of the processes involved when lightning strikes the CNT is important for ensuring that the safety and electromagnetic compatibility of such devices are met. |
| Research Group: | Energy Systems |
| Degree Program: | Ph.D. |
| Author Bio: | Ivan Boev was born in Sofia, Bulgaria. He received the M.S. degree in electrical power engineering from the Technical University - Sofia in 1998 and the M.A.Sc. degree in electrical engineering from the University of Toronto in 2006. He is currently working towards the completion of a Ph.D degree in electrical engineering at the University of Toronto. His research interests include power systems transients and dynamics, electromagnetic compatibility, lightning impact over power installations, and EM Pulse generated by tall structures. Ivan Boev is the recipient of "Paul Biringer Graduate Scholarship" and "Helmut Brosz Graduate Scholarship" for 2006 for Lightning Studies research. |